Types of Spring Contact Probes, Tip Styles and Applications

Types of Spring Contact Probes, Tip Styles and Applications

            A test-probe ranges from very simple devices to the most sophisticated and expensive complex probes. Having that said, there are various types of spring contact probes, tips styles, and their applications that many probe head manufacturer offers and you will get to know more of them through this article.

            Some of The Most Common Types of Spring Contact Probes

  • ICT/FTC probes for test fixtures – These probes are text fixtures for In-Circuit-Test and Functional Test which has a standard for the center at 50mil, 75mil, and 100mil.
  • Short travel probes – These probes are compact probes with limited travel and are most often used as a battery or charge contact.
  • Interface Probes – This type of probes fall with the interface between a test fixture and a test system realized by interface probes that are being standardized for each system.
  • Probes with a rolling ball – This is a developed special contact probe series with a rolling ball as its contact element. This type of probes is less sensitive to the lateral forces and provide higher durability compared to standard probes with only round tip styles.
  • Threaded probes – These contact probes are most often used in modules for the test of wire harnesses and connectors. This probe does out of the receptacle despite under difficult conditions and so it does secure a seat in the module or fixture is being guaranteed.
  • High current probes – These probes are being designed in different versions for the high current application for a very small probe resistance.
  • Switch Probes – These are special probes integrated with switch elements and are most often used for presence tests. These open or close an electric circuit after a define travel phase of the plunger.

Most Common Tip Styles and Their Applications

  • These are suitable for solder pads and contact pins.
  • A universal tip style with different angles of degrees 10, 15, 30, 60, 90, or 120 for contacting solder pads and holes.
  • 4-point crown. Used for pad surfaces and soldered pins which have sharp edges that penetrate flux residues and oxide layers.
  • Used for testing plated through holes and pads equipped with sharp edges to penetrate contamination and oxide layers.
  • Insulating Cap. Equipped for detecting the correct length and straightness of pins.
  • Equipped for testing clean contact surfaces and does not leave marks or scratches.
  • Multipoint connectors. Designed for contacting multipoint connectors.
  • Used for wire wrap posts even if contacts get bent or twisted.
  • A universal tip which is most often used for wires, contact pins, and wire wrap posts.

            Having enough knowledge of the types of probes and its tips and application will enable you to gain a wider preference of which probe head you need. Although this article may not cover you all the types and applications, this covered most of them to give you help for your spring contact needs!